• DocumentCode
    1022784
  • Title

    Assessment of dielectric degradation by ultrawide-band PD detection

  • Author

    Morshuis, Peter

  • Author_Institution
    High Voltage Lab., Delft Univ. of Technol., Netherlands
  • Volume
    2
  • Issue
    5
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    744
  • Lastpage
    760
  • Abstract
    Partial discharges (PD) and the way they affect insulation quality has for decades been a rewarding subject for many researchers. There are two topics that are of particular interest to the workers in the field of PD. One is the impact of a wide variety of statistical tools on the interpretation of discharge data obtained with standard PD detection apparatus according to IEC270. The other topic is the study of discharge-induced degradation processes by looking into the physics of the discharge process. This can be done by different means but a valuable technique, at least for the laboratory, is the use of ultra-wide band PD detection systems. This paper is a mix of a short review on the progression in the understanding of deterioration by internal PD obtained with such systems and of results recently obtained by the author
  • Keywords
    ageing; charge measurement; insulation testing; partial discharges; aging; dielectric degradation; discharge pulse shape; discharge-induced degradation processes; fast filamentary discharge; insulation quality; internal PD; partial discharges; slow discharge pulse; ultrawide-band PD detection; Bandwidth; Cameras; Degradation; Dielectrics and electrical insulation; Oscilloscopes; Partial discharges; Physics; Pulse measurements; Velocity measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.469971
  • Filename
    469971