Title :
Charge-storage in insulator films and its effect on semiconductor surfaces
Author :
Thomas, J.E., Jr.
fDate :
11/1/1964 12:00:00 AM
Keywords :
Frequency; Insulation; Laboratories; Magnetic fields; Plasma density; Plasma devices; Plasma properties; Plasma waves; Semiconductor films; Solid state circuits;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1964.15398
