DocumentCode
1024166
Title
Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin films
Author
Rudman, D.A. ; Juang, J.Y. ; van Dover, R.B. ; Nakahara, S. ; Capone, D.W., II ; Talvacchio, J.
Author_Institution
Massachusetts Institute of Technology, Cambridge, MA
Volume
23
Issue
2
fYear
1987
fDate
3/1/1987 12:00:00 AM
Firstpage
831
Lastpage
838
Abstract
The upper critical field of most polycrystalline NbN thin films is anisotropic. with the perpendicular critical field Hc2 (
) larger than the parallel critical field-Hc2 (∥). We have measured the angular dependence Hc2 (Θ) for samples with both a columnar and non-columnar microstructure. In both cases we find a rounded maximum near Hc2 (
). The shape of Hc2 (Θ), combined with the known microstructure of the films and the linear temperature dependence of Hc2 for both field orientations leads us to conclude that the mechanism responsible for this anisotropy is an anisotropic conductivity in the film, probably due to differences in the grain boundary resistance in the plane of the film and normal to the film. In contrast, a single crystal film shows only surface superconductivity.
) larger than the parallel critical field-H
). The shape of HKeywords
Superconducting films; Anisotropic conductive films; Anisotropic magnetoresistance; Conductivity; Grain boundaries; Microstructure; Shape; Superconducting films; Surface resistance; Temperature dependence; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1065011
Filename
1065011
Link To Document