• DocumentCode
    1024166
  • Title

    Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin films

  • Author

    Rudman, D.A. ; Juang, J.Y. ; van Dover, R.B. ; Nakahara, S. ; Capone, D.W., II ; Talvacchio, J.

  • Author_Institution
    Massachusetts Institute of Technology, Cambridge, MA
  • Volume
    23
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    831
  • Lastpage
    838
  • Abstract
    The upper critical field of most polycrystalline NbN thin films is anisotropic. with the perpendicular critical field Hc2( \\perp ) larger than the parallel critical field-Hc2(∥). We have measured the angular dependence Hc2(Θ) for samples with both a columnar and non-columnar microstructure. In both cases we find a rounded maximum near Hc2( \\perp ). The shape of Hc2(Θ), combined with the known microstructure of the films and the linear temperature dependence of Hc2for both field orientations leads us to conclude that the mechanism responsible for this anisotropy is an anisotropic conductivity in the film, probably due to differences in the grain boundary resistance in the plane of the film and normal to the film. In contrast, a single crystal film shows only surface superconductivity.
  • Keywords
    Superconducting films; Anisotropic conductive films; Anisotropic magnetoresistance; Conductivity; Grain boundaries; Microstructure; Shape; Superconducting films; Surface resistance; Temperature dependence; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1065011
  • Filename
    1065011