• DocumentCode
    1024571
  • Title

    Experimental evidences of the interdependences of the fixed charges, the chargeable surface states and the bulk impurity recombination states in the silicon-oxide silicon structures

  • Author

    Sah, C.T. ; Collins, D.R.

  • Volume
    12
  • Issue
    9
  • fYear
    1965
  • fDate
    9/1/1965 12:00:00 AM
  • Firstpage
    505
  • Lastpage
    505
  • Keywords
    Charge carrier processes; Impurities; Laboratories; Optical modulation; Semiconductor device noise; Semiconductor diodes; Silicon; Surface treatment; Telephony; Velocity measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1965.15566
  • Filename
    1474030
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1024571