• DocumentCode
    1024761
  • Title

    Surface effects on silicon P-N junctions: The origin of anomalous channel currents

  • Author

    Grove, A.S. ; Fitzgerald, D.J.

  • Volume
    12
  • Issue
    9
  • fYear
    1965
  • fDate
    9/1/1965 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    509
  • Keywords
    Admittance measurement; Capacitance measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Measurement uncertainty; P-n junctions; Pollution measurement; Silicon; Surface impedance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1965.15586
  • Filename
    1474050
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1024761