Title :
Surface effects on silicon P-N junctions: The origin of anomalous channel currents
Author :
Grove, A.S. ; Fitzgerald, D.J.
fDate :
9/1/1965 12:00:00 AM
Keywords :
Admittance measurement; Capacitance measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Measurement uncertainty; P-n junctions; Pollution measurement; Silicon; Surface impedance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15586
