DocumentCode
1025941
Title
Probed determination of turn-on spread of large area thyristors
Author
Dodson, W.H. ; Longini, R.L.
Author_Institution
Sandia Corp., Albuquerque, N. Mex.
Issue
5
fYear
1966
fDate
5/1/1966 12:00:00 AM
Firstpage
478
Lastpage
484
Abstract
Thyristors (SCR\´s) were specially constructed to permit the direct observation of the lateral spread of turn-on within the device. The effects on the spread of turn-on of the load current, basewidths, temperature, anode-cathode voltage, gate control pulse, and a large inhomogeneity were observed. The spreading velocity of the on-state and the load current are related approximately by the expression
at high load currents. The spreading velocity is higher in devices with narrower basewidths and increases with temperature. Neither the anode-cathode voltage before turn-on nor the gate control pulse affect the spreading velocity of the on-state. Measurements on end gate devices and center gate linear devices show that triggering at the center enables an equivalent area of the SCR to turn on in less time than occurs when triggering at the end. A large gap in the emitter layer will delay the spread of the on-state but will not necessarily stop the spreading.
at high load currents. The spreading velocity is higher in devices with narrower basewidths and increases with temperature. Neither the anode-cathode voltage before turn-on nor the gate control pulse affect the spreading velocity of the on-state. Measurements on end gate devices and center gate linear devices show that triggering at the center enables an equivalent area of the SCR to turn on in less time than occurs when triggering at the end. A large gap in the emitter layer will delay the spread of the on-state but will not necessarily stop the spreading.fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1966.15715
Filename
1474305
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