Easy axis orientation mapping of soft magnetic films using a magneto-optic Kerr BH imager

Author

Gudeman, C.S. ; Peter, D.F. ; Best, J.S. ; Cheng, D.C.

Author_Institution

IBM Almaden Res. Center, San Jose, CA, USA

Volume

25

Issue

5

fYear

1989

fDate

9/1/1989 12:00:00 AM

Firstpage

4207

Lastpage

4209

Abstract

A novel method of easy-axis orientation (EAO) mapping for thin magnetic films is described. The method employs a magnetooptic Kerr sensor to detect the discrete switches in film magnetization direction that occur when a rotating magnetic field |H|<H_k is applied to a magnetically anisotropic thin film. An instrument implementing this method has been constructed and is capable of generating easy-axis maps at a rate of 3 locations/s with 1° accuracy. Experimental measurements show that the EAO determination is only slightly sensitive to stray fields, such as the Earth´s field. The optical properties of thin layers covering the magnetic film have been observed to lead to distortions in the Kerr signal, although these distortions do not affect the accuracy of the EAO measurements

Keywords

Kerr magneto-optical effect; magnetic thin films; magnetic variables measurement; materials testing; EAO determination; easy axis orientation mapping; film magnetization direction; magnetically anisotropic thin film; magneto-optic Kerr BH imager; magnetooptic Kerr sensor; optical properties; rotating magnetic field; soft magnetic films; thin magnetic films; Distortion measurement; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic sensors; Magnetic switching; Magnetization; Optical distortion; Switches; Thin film sensors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.42570

Filename

42570