• DocumentCode
    1028083
  • Title

    X-band MMIC amplifier with pulse-doped GaAs MESFET´s

  • Author

    Shiga, Nobuo ; Nakajima, Shigeru ; Otobe, Kenji ; Sekiguchi, Takeshi ; Kuwata, Nobuhiro ; Matsuzaki, Ken-Ichiro ; Hayashi, Hideki

  • Author_Institution
    Sumimoto Electr. Ind. Ltd., Yokohama, Japan
  • Volume
    39
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1987
  • Lastpage
    1994
  • Abstract
    The design and test of an X-band monolithic four-stage low-noise amplifier (LNA) with 0.5 μm-gate pulse-doped GaAs MESFETs for application in a direct broadcast satellite (DBS) converter is presented. The key feature of the research is a detailed demonstration of the advantages of using series feedback with experiments and simulations. This LNA shows an excellent input VSWR match under 1.4 as well as a noise figure of 1.67 dB and a gain of 24 dB at 12 GHz. The noise figure, the gain and VSWRs exhibit very little bias current dependence due to the exceptional features of the pulse-doped structure FETs and the optimized circuit design. Insensitivity to bias current implies performance stability in the face of process fluctuations. Thus, the yield of chips with noise figures of less than 2.0 dB is as high as 62.5%, and the variations of gain and VSWR are highly uniform as well
  • Keywords
    III-V semiconductors; MMIC; Schottky gate field effect transistors; feedback; field effect integrated circuits; gallium arsenide; microwave amplifiers; 0.5 micron; 1.67 dB; 12 GHz; 24 dB; DBS convertor; GaAs; MESFETs; MMIC amplifier; SHF; X-band; direct broadcast satellite; four stage LNA; low-noise amplifier; optimized circuit design; performance stability; pulse-doped structure FETs; series feedback; submicron gate; Feedback; Gain; Gallium arsenide; Impedance matching; Low-noise amplifiers; MESFETs; Noise figure; Pulse amplifiers; Satellite broadcasting; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.106537
  • Filename
    106537