• DocumentCode
    1028635
  • Title

    High voltage breakdown of titania in vacuo

  • Author

    Englefield, Colin G. ; Harwood, Vivienne J. ; Toso, L.W.

  • Author_Institution
    University of Alberta, Edmonton, Canada
  • Volume
    14
  • Issue
    8
  • fYear
    1967
  • fDate
    8/1/1967 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    449
  • Abstract
    The electrical breakdown of titania in a vacuum using static electric fields is investigated experimentally, by examination of current and temperature variation at different applied voltages. Thermal instability is found to occur at voltages above a critical value. This leads to sufficiently high temperatures to cause the reduction of the titania into a lower-order semiconducting oxide, which carries the breakdown current. The breakdown of titania and a vacuum gap in series is also investigated. Evidence gathered from temperature and current readings suggests that, at high voltages, part of the voltage originally across the vacuum gap appears across the titania. Evidence to support this theory is obtained from measurements of the mechanical force appearing across the vacuum gap which enable the voltage redistribution to be calculated. The voltage redistribution is due to an excess charge appearing on the surface of the ceramic, due to pre-breakdown currents in the vacuum gap. When the voltage across the titania reaches a large enough value, thermal instability occurs leading to breakdown of the titania.
  • Keywords
    Breakdown voltage; Dielectric breakdown; Electric breakdown; Force measurement; Lead compounds; Mechanical variables measurement; Semiconductivity; Semiconductor device breakdown; Temperature; Vacuum breakdown;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.15979
  • Filename
    1474702