• DocumentCode
    1029033
  • Title

    Failure modes in silicon avalanche transit-time microwave devices

  • Author

    Schenck, J.F. ; Midford, T.A.

  • Volume
    14
  • Issue
    9
  • fYear
    1967
  • fDate
    9/1/1967 12:00:00 AM
  • Firstpage
    619
  • Lastpage
    620
  • Abstract
    A type of avalanche diode has been subjected to accelerated life test and to failure analysis. The primary failure mechanism is believed to be a form of second breakdown; no significant progressive degradation was observed.
  • Keywords
    Copper; Degradation; Diodes; Electric breakdown; Electromagnetic heating; Failure analysis; Life testing; Microwave devices; Partial response channels; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.16019
  • Filename
    1474742
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1029033