• DocumentCode
    1032008
  • Title

    A Practical Approach to Calculating Optimum Performance of Semiconductor Rectifiers

  • Author

    Wilson, Earl D.

  • Author_Institution
    Westinghouse Research Laboratories, East Pittsburgh, Pa.
  • Volume
    67
  • Issue
    1
  • fYear
    1948
  • Firstpage
    640
  • Lastpage
    642
  • Abstract
    Applying Kirchoff´s circuit laws to a conventional four-arm rectifier bridge, an expression is derived for efficiency in terms of R (effective reverse resistance of one arm), F (effective forward resistance of one arm), and L (ohmic load resistance). Knowing that R and F can be kept constant by separate adjustments of input voltage and temperature of the cells enables us to maximize efficiency, E, with respect to L. The optimum value of L turns out to be ??RF, the geometrical mean of forward and reverse resistances. This value of L yields Emax = [(q - 1)/(q + 1)]2, where q = ??R/F. Further analysis shows that ??R/F = VR/VF for optimum L, where VR and VF are corresponding values of reverse and forward voltage drops, so that Emax is expressible in terms of VR and VF alone. Three families of curves are given to illustrate manipulation of the simple empirical data required, resulting in a final plot of Emax versus temperature for various current densities in the cells. An important feature of the process depends on the interesting analytical result that for maximum efficiency the reverse and forward losses are equal, making it possible to correlate values of VR and VF. Because the empirical data involved are strictly applicable only when R and F are not appreciably affected by previous values of VF and VR respectively, a modified technique is suggested in which data are observed only when optimum L is in the circuit.
  • Keywords
    Bridge circuits; Current density; Equations; Flyback transformers; Performance analysis; Rectifiers; Temperature dependence; Voltage;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1948.5059723
  • Filename
    5059723