DocumentCode :
1032710
Title :
A 0.13-μm CMOS serializer for data and trigger optical links in particle physics experiments
Author :
Cervelli, Giovanni ; Marchioro, Alessandro ; Moreira, Paulo
Author_Institution :
Eur. Lab. for Particle Phys., Geneva, Switzerland
Volume :
51
Issue :
3
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
836
Lastpage :
841
Abstract :
A 3.2-Gbit/s serializer prototype has been fabricated in a 0.13-μm CMOS technology to demonstrate its applicability within future Large Hadron Collider (LHC) data readout and trigger systems. The IC includes a clock-multiplying phase-locked-loop (PLL), a 50-Ω line driver, internal self-testing features, and data pattern generation. The serial output stream is 8 B/10 B encoded for compatibility with commercial receivers. Radiation hardening layout techniques have been adopted, which guarantee radiation tolerant operation inside the innermost LHC detectors over more than 10 yr. This paper describes the circuit architecture and reports on the experimental results. Signal quality (jitter, noise floor, eye opening) and bit-error rate (BER) are measured at different transmission rates using laboratory instrumentation and dedicated test beds.
Keywords :
CMOS integrated circuits; error statistics; high-speed integrated circuits; ion accelerators; jitter; nuclear electronics; optical communication; optical links; phase locked loops; proton accelerators; prototypes; radiation hardening (electronics); readout electronics; storage rings; synchrotrons; CMOS integrated circuits; CMOS serializer prototype; Large Hadron Collider; bit-error rate; clock-multiplying phase-locked-loop; data optical links; data pattern generation; data readout; eye opening; high-energy physics collider; high-speed electronics; internal self-testing feature; jitter; noise floor; optical communication; particle physics experiments; radiation hardening layout technique; radiation tolerant operation; serial output stream; signal quality; trigger optical links; trigger system; Bit error rate; Built-in self-test; CMOS technology; Clocks; Driver circuits; Large Hadron Collider; Optical fiber communication; Phase locked loops; Prototypes; Radiation hardening; CMOS integrated circuits; high speed electronics; optical communication; radiation hardening;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.829551
Filename :
1311978
Link To Document :
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