• DocumentCode
    1034040
  • Title

    Observations of multipactor in magnetrons

  • Author

    Vaughan, J. Rodney M

  • Author_Institution
    Litton Industries, San Carlos, Calif.
  • Volume
    15
  • Issue
    11
  • fYear
    1968
  • fDate
    11/1/1968 12:00:00 AM
  • Firstpage
    883
  • Lastpage
    889
  • Abstract
    The process of back-bombardment of a magnetron cathode is considered as a single-surface multipactor. Experimental evidence is given, showing that this back-bombardment is concentrated in lines on the cathode surface, whose intensity is controlled by the RF voltage, and position by the dc voltage and magnetic field. The operating equations of a series-field magnetron are given, and experimentally the performance is shown to follow the Langmuir-Childs, Hull, and Hartree curves in sequence (in distinction to a conventional fixed-field magnetron which operates only near the Hartree voltage). A semiquantitative explanation is given of the bombardment lines, and their dependence on the voltage. A cathode with grooves at the position of the bombardment lines is found to receive much less back-bombardment, and to have a more favorable variation of the residual bombardment as a function of output loading. Multipactor between vane tips of a very lightly loaded magnetron was observed through a large glass window, and was seen to be the cause of a vane tip melting problem. Axial multipactor discharges between vane tips and the pole pieces were also seen; being parallel to the magnetic field, these saturate at a low power level and do no harm. Finally, an axial electron discharge was seen, which appeared to have some of the characteristics of a multipactor, but is not really understood. This discharge destroyed the tube after a few minutes, ending the investigation.
  • Keywords
    Blades; Cathodes; Electrons; Equations; Glass; Magnetic fields; Magnetrons; Radio frequency; Voltage control; Windows;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16532
  • Filename
    1475434