DocumentCode
1034880
Title
In situ electric probe method for determining the dielectric properties of materials
Author
Misra, Devendra K.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
Volume
37
Issue
1
fYear
1988
fDate
3/1/1988 12:00:00 AM
Firstpage
157
Lastpage
160
Abstract
An attempt is made to use the induced-EMF (electromagnetic field) method for input impedance determination of an antenna in order to compute the dielectric behavior of the medium over a large range of probe lengths. Numerical results obtained by this approach are compared with those of other existing theories valid for different probe lengths as well as with available experimental data. A fairly close agreement is found among these results
Keywords
antennas; dielectric measurement; numerical methods; probes; antenna; coaxial line; dielectric properties of materials; in situ electric probe; induced-EMF; input impedance; numerical methods; Circuits; Dielectric materials; Dielectric measurements; Flip-flops; Impedance; Length measurement; Probes; Pulse amplifiers; Statistical analysis; Transmitters;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.2690
Filename
2690
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