DocumentCode

1035375

Title

CIP: A new technique for measuring doping profiles

Author

Copeland, J.A.

Volume

16

Issue

2

fYear

1969

fDate

2/1/1969 12:00:00 AM

Firstpage

246

Lastpage

246

Keywords

Acoustical engineering; Detectors; Doping profiles; Frequency; Interface states; Optical scattering; Schottky barriers; Schottky diodes; Silicon; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1969.16669

Filename

1475711