Title :
Gain- and phase-matched low-noise TWT amplifiers
Author :
Frost, R.D. ; Hershyn, W.
fDate :
2/1/1969 12:00:00 AM
Keywords :
Circuit faults; Circuit testing; Electric shock; Frequency conversion; Low-noise amplifiers; Power supplies; Power system protection; Satellite communication; Satellite ground stations; Transmitters;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16681
