DocumentCode
1035494
Title
Hall-effect devices
Author
Epstein, Max
Author_Institution
Northwestern University, Evanston, Ill
Volume
3
Issue
3
fYear
1967
fDate
9/1/1967 12:00:00 AM
Firstpage
352
Lastpage
359
Abstract
The Hall effect and magnetoresistance in solids is discussed in terms of the Lorentz force on current carriers. The advances in thin-film high-mobility semiconductors are related to the increased utilization and developments of Hall-effect devices. The design of such devices depends, in most cases, on the associated magnetic structures. Several examples of applications of Hall-effect and magnetoresistive devices to measurements, communications, and controls are presented. Limitations in performance due to magnetic structures, current noise, and various other galvanomagnetic and thermomagnetic effects are discussed to indicate the range of capabilities of the devices.
Keywords
Hall effect devices; Magnetoresistive devices; Hall effect; Hall effect devices; Lorentz covariance; Magnetic devices; Magnetic semiconductors; Magnetoresistance; Magnetoresistive devices; Semiconductor thin films; Solids; Thin film devices;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1967.1066071
Filename
1066071
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