• DocumentCode
    1035494
  • Title

    Hall-effect devices

  • Author

    Epstein, Max

  • Author_Institution
    Northwestern University, Evanston, Ill
  • Volume
    3
  • Issue
    3
  • fYear
    1967
  • fDate
    9/1/1967 12:00:00 AM
  • Firstpage
    352
  • Lastpage
    359
  • Abstract
    The Hall effect and magnetoresistance in solids is discussed in terms of the Lorentz force on current carriers. The advances in thin-film high-mobility semiconductors are related to the increased utilization and developments of Hall-effect devices. The design of such devices depends, in most cases, on the associated magnetic structures. Several examples of applications of Hall-effect and magnetoresistive devices to measurements, communications, and controls are presented. Limitations in performance due to magnetic structures, current noise, and various other galvanomagnetic and thermomagnetic effects are discussed to indicate the range of capabilities of the devices.
  • Keywords
    Hall effect devices; Magnetoresistive devices; Hall effect; Hall effect devices; Lorentz covariance; Magnetic devices; Magnetic semiconductors; Magnetoresistance; Magnetoresistive devices; Semiconductor thin films; Solids; Thin film devices;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1967.1066071
  • Filename
    1066071