High-temperature superconducting shift registers operating at up to 100 GHz

Author

Martens, Jon S. ; Pance, Aleksandar ; Char, Kookrin ; Johansson, Marie E. ; Whiteley, Stephen R. ; Wendt, Joel R. ; Hietala, Vincent M. ; Plut, Tom A. ; Ashby, Carol I.H. ; Hou, Shang Y. ; Phillips, Julia M.

Author_Institution

Conductus Inc., Sunnyvale, CA, USA

Volume

29

Issue

1

fYear

1994

fDate

1/1/1994 12:00:00 AM

Firstpage

56

Lastpage

62

Abstract

Shift registers have been demonstrated in YBaCuO operating at 77 K using from 64 to over 1000 junctions. These are some of the larger scale integrated circuits demonstrated to date using YBaCuO Josephson technology. The circuit is a modified rapid single flux quantum design in which a single trigger pulse causes a one bit shift of the entire word of 32-512 b in length. Two different junction technologies, electron-beam defined nanobridges and epitaxial edge junctions, have been used with parameter spreads ranging from 11% to 22%. Correct operation has been verified with low speed random word tests and circulating data tests while pseudo random bit sequence demonstrations are underway. A practical amount of time to shift between cells has been measured to be about 10 ps

Keywords

barium compounds; high-temperature superconductors; logic testing; nanotechnology; shift registers; superconducting logic circuits; yttrium compounds; 10 ps; 100 GHz; 32 to 512 bit; 77 K; YBaCuO; YBaCuO Josephson technology; cell shift time; circulating data tests; electron-beam defined nanobridges; epitaxial edge junctions; high-temperature superconductor; large scale integrated circuits; low speed random word tests; pseudo random bit sequence demonstrations; rapid single flux quantum design; shift registers; single trigger pulse; High temperature superconductors; Integrated circuit technology; Josephson junctions; Pulse circuits; Shift registers; Superconducting epitaxial layers; Superconducting integrated circuits; Testing; Time measurement; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.272094

Filename

272094