Title :
Investigation of domain walls in thin films by low-angle electron deflection
Author_Institution :
AEG-Telefunken Forschungsinstitut, Ulm, Germany
fDate :
9/1/1969 12:00:00 AM
Keywords :
Iron-nickel films; Magnetic domains; Nickel-iron films; Diffraction; Electron beams; Electron microscopy; Kernel; Magnetic films; Magnetization; Magnetosphere; Tail; Transistors; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066536
