DocumentCode
1040705
Title
Critical race-free low-power nand match line content addressable memory tagged cache memory
Author
Chaudhary, V. ; Chen, T.-H. ; Sheerin, F. ; Clark, L.T.
Author_Institution
Arizona State Univ., Tempe
Volume
2
Issue
1
fYear
2008
fDate
1/1/2008 12:00:00 AM
Firstpage
40
Lastpage
44
Abstract
A low-power content addressable memory (CAM)-tagged microprocessor cache using dynamic hierarchical NAND match lines is presented, emphasising the timing impact on overall cache design. Low-capacitive clock loading and lower NAND CAM match line activity factor provide a total cache tag power dissipation savings of up to 64% over a conventional design with NOR match lines. The circuit design, operation and physical layout are described. Results measured on a 0.13-mum low standby power foundry process demonstrate 3.29 fJ/bit/search CAM tag energy at VDD = 0.9 V and nearly 1 GHz operating frequency at VDD = 1.75 V. The NAND match lines allow a completely critical race-free cache memory design, which improves robustness at high-scaled process technology nodes, while maintaining fast single-cycle access times.
Keywords
cache storage; content-addressable storage; integrated circuit design; logic gates; low-power electronics; microprocessor chips; cache design; circuit design; critical race-free low-power NAND match line; dynamic hierarchical NAND match lines; low-capacitive clock loading; low-power content addressable memory; power dissipation savings; tagged cache memory; tagged microprocessor cache; voltage 0.9 V; voltage 1.75 V;
fLanguage
English
Journal_Title
Computers & Digital Techniques, IET
Publisher
iet
ISSN
1751-8601
Type
jour
DOI
10.1049/iet-cdt:20070040
Filename
4435124
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