DocumentCode
10408
Title
Effect of Low and High Power Continuous Wave Electromagnetic Interference on a Microwave Oscillator System: From VCO to PLL to QPSK Receiver
Author
Dubois, T. ; Laurin, Jean-Jacques ; Raoult, Jeremy ; Jarrix, Sylvie
Author_Institution
IMS Bordeaux Lab., Univ. of Bordeaux, Bordeaux, France
Volume
56
Issue
2
fYear
2014
fDate
Apr-14
Firstpage
286
Lastpage
293
Abstract
This paper presents the effects of a continuous wave electromagnetic interference (EMI) on a discrete microwave phase-locked loop (PLL). Susceptibility of the voltage-controlled oscillator (VCO) is first studied as a standalone circuit before being integrated into the PLL. The effects observed on the VCO alone and when it is integrated into the PLL are analyzed as a function of the frequency and power of the interference signal. Most of the effects observed are due to intrinsic nonlinearities of the VCO. Some of them, like intermodulation and injection pulling can be predicted by the small-signal perturbation theory, while others such as a phase unlocking condition generated by strong EMI injection cannot. Finally, the consequence of using such an EMI affected PLL used as a local oscillator in a QPSK receiver, is examined. In all cases, the EMI is injected at the output of the VCO through inductive coupling.
Keywords
electromagnetic interference; oscillators; phase locked loops; quadrature phase shift keying; voltage control; EMI; PLL; QPSK receiver; VCO; continuous wave electromagnetic interference; discrete microwave phase-locked loop; inductive coupling; injection pulling; intermodulation; microwave oscillator system; small-signal perturbation theory; standalone circuit; voltage-controlled oscillator; Electromagnetic interference; Frequency measurement; Phase locked loops; Probes; Receivers; Voltage-controlled oscillators; Electromagnetic interference (EMI); QPSK receiver; injection locking; injection pulling; near-field probe; phase-locked loop (PLL); strong EMI injection; voltage-controlled oscillator (VCO);
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2013.2280670
Filename
6600893
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