• DocumentCode
    1042017
  • Title

    Steady-state junction temperatures of semiconductor chips

  • Author

    Lindsted, Robert D. ; Surty, Rohinton J.

  • Author_Institution
    Wichita State University, Wichita, Kans.
  • Volume
    19
  • Issue
    1
  • fYear
    1972
  • fDate
    1/1/1972 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    44
  • Abstract
    The temperature drop between a transistor junction and the base of a silicon chip is dependent upon the power to be dissipated as well as the geometry of the device. This problem in three-dimensional heat conduction is analytically solved for boundary conditions which approximate a set of operating conditions. Nondimensional curves and examples summarizing typical solutions have been included to illustrate problem solving techniques.
  • Keywords
    Boundary conditions; Conductors; Geometry; Helium; Integrated circuit packaging; Problem-solving; Silicon; Steady-state; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17369
  • Filename
    1476840