DocumentCode :
1042803
Title :
Effect of post-reflow no-clean solder paste residue on electrical performance
Author :
Beikmohamadi, Allan
Author_Institution :
DuPont Electron., Research Triangle Park, NC, USA
Volume :
16
Issue :
8
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
799
Lastpage :
801
Abstract :
An experiment was conducted to examine the effect of postreflow no-clean solder paste residue of near-end and far-end signal crosstalk due to changes in dielectric constant and leakage resistance in the circuit environment. Additionally, the effect of different frequency levels on postreflow residue was examined. The results suggest that postreflow residues affect the signal-to-noise ratio on circuit boards, depending on the chemistry, residue level, and dielectric properties of these pastes. Higher levels of residues may cause signal degradation on the transmission lines. The noise level on circuit boards increases significantly if a solder paste exhibits excessive residue. Increased crosstalk is believed to be caused by an increase in the dielectric constant (excessive postreflow residues) between two transmission lines. The effect of postreflow residue on circuit performances was more noticeable at frequencies greater than 1 MHz
Keywords :
crosstalk; permittivity; printed circuit manufacture; printed circuit testing; soldering; surface treatment; 1 MHz; PCB fabrication; SNR; circuit boards; circuit environment; dielectric constant; electrical performance; leakage resistance; noise level; post-reflow no-clean solder paste residue; postreflow residues; signal crosstalk; signal degradation; signal-to-noise ratio; transmission lines; Chemistry; Crosstalk; Degradation; Dielectric constant; Distributed parameter circuits; Electric resistance; Frequency; Noise level; Printed circuits; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.273677
Filename :
273677
Link To Document :
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