• DocumentCode
    1043085
  • Title

    A 10-kV Monolithic Darlington Transistor With \\beta _{ \\rm forced} of 336 in 4H-SiC

  • Author

    Zhang, Qingchun ; Jonas, Charlotte ; O´Loughlin, Michael ; Callanan, Robert ; Agarwal, Anant ; Scozzie, Charles

  • Author_Institution
    Cree Inc., Research Triangle Park, NC
  • Volume
    30
  • Issue
    2
  • fYear
    2009
  • Firstpage
    142
  • Lastpage
    144
  • Abstract
    4H-SiC bipolar Darlington transistors with a record-high current gain have been demonstrated. The dc forced current gain was measured up to 336 at 200 W/cm2 ( J C = 35 A/cm2 at V CE = 5.7 V) at room temperature. The current gain exhibits a negative temperature coefficient and remains as high as 135 at 200degC. The specific on-resistance is 140 mOmegamiddotcm2 at room temperature and increases at elevated temperatures. An open-emitter breakdown voltage (BV CBO) of 10 kV was achieved at a leakage current density of < 1 mA/cm2. The device exhibits an open-base breakdown voltage (BV CEO) of 9.5 kV. The high current gain of SiC Darlington transistors can significantly reduce the gate-drive power consumption with the same forward-voltage drop as that of 10-kV SiC bipolar junction transistors, thus making the device attractive for high-power high-temperature applications.
  • Keywords
    bipolar transistors; current density; leakage currents; silicon compounds; wide band gap semiconductors; SiC; bipolar junction transistors; dc forced current gain; forward-voltage drop; gate-drive power consumption; high-power high-temperature applications; leakage current density; monolithic bipolar Darlington transistor; negative temperature coefficient; open-base breakdown voltage; open-emitter breakdown voltage; record-high current gain; specific on-resistance; temperature 200 degC; temperature 293 K to 298 K; voltage 10 kV; voltage 5.7 V; voltage 9.5 kV; $BV_{ rm CBO}$; $BV_{rm CEO}$; Bipolar junction transistors (BJTs); Darlington transistor; current gain; silicon carbide;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2009953
  • Filename
    4721608