DocumentCode :
104357
Title :
The Effect of Cadmium Chloride Treatment on Close-Spaced Sublimated Cadmium Telluride Thin-Film Solar Cells
Author :
Abbas, Asad ; West, G.D. ; Bowers, J.W. ; Isherwood, P. ; Kaminski, P.M. ; Maniscalco, B. ; Rowley, Paul ; Walls, Jeffrey M. ; Barricklow, K. ; Sampath, W.S. ; Barth, Kurt L.
Author_Institution :
Dept. of Mater., Loughborough Univ., Loughborough, UK
Volume :
3
Issue :
4
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1361
Lastpage :
1366
Abstract :
The aim of this investigation is to apply advanced microstructural characterization techniques to study the effect of cadmium chloride treatment on the physical properties of cadmium telluride (CdTe) solar cells deposited via close-spaced sublimation and relate these to cell performance. A range of techniques have been used to observe the microstructural changes as well as the chemical changes before and after the cadmium chloride treatment. Electrical measurements that link the device performance with the microstructural properties of the cells have also been undertaken. Transmission electron microscopy (TEM) has revealed high densities of stacking faults in the as-grown CdTe samples. Further, it has been observed that these stacking faults are removed during the cadmium chloride treatment. These observations show that the presence of chlorine plays an important role in the removal of these defects and the subsequent production of high efficiency thin-film CdTe solar cells. Elemental analysis in the TEM indicates chlorine-rich regions appearing at the CdTe/CdS interface as well as at grain boundaries after the treatment.
Keywords :
II-VI semiconductors; cadmium compounds; crystal microstructure; grain boundaries; semiconductor thin films; solar cells; stacking faults; sublimation; transmission electron microscopy; CdTe-CdS; TEM; cadmium chloride treatment effect; close-spaced sublimated cadmium telluride thin-film solar cells; electrical measurements; elemental analysis; grain boundaries; microstructural characterization techniques; physical properties; stacking faults; transmission electron microscopy; Annealing; Cadmium compounds; Electric variables measurement; Thin film devices; Transmission electron microscopy; Cadmium chloride; cadmium telluride (CdTe); close-space sublimation (CSS); thin-film photovoltaics;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2264995
Filename :
6531632
Link To Document :
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