Title :
Transient Response Characteristics of Capacitive Potential Devices
Author :
Sweetana, Andrew
Author_Institution :
Westinghouse Electric Corporation
Abstract :
Full voltage line to ground fault tests are performed on typical potential devices and the subsidence transient recorded. To show the worst case of residual voltage, faults are initiated while the primary voltage is passing through crest and zero.
Keywords :
Circuit analysis computing; Circuit faults; Circuit testing; Equivalent circuits; Oscilloscopes; Power system transients; Protective relaying; Switches; Transient response; Voltage;
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
DOI :
10.1109/TPAS.1971.292994
