DocumentCode :
1044516
Title :
Reversible thermal breakdown as a switching mechanism in chalcogenide glasses
Author :
Warren, Anthony C.
Author_Institution :
PA Technology and Science Centre, Cambridge, England
Volume :
20
Issue :
2
fYear :
1973
fDate :
2/1/1973 12:00:00 AM
Firstpage :
123
Lastpage :
131
Abstract :
A review of the main features of chalcogenide glass switches is given and interpreted in terms of a thermal runaway mechanism. It is shown that a simple one-dimensional theory is insufficient for describing thin films, and several developments are discussed, including field-dependent effects, channeling instabilities, and electrode hot spots. Suggestions for future work, both theoretical and experimental, that may help to discriminate between thermal and electronic mechanisms are made.
Keywords :
Amorphous materials; Delay effects; Electric breakdown; Electrodes; Glass; Resistance heating; Space technology; Switches; Thermal conductivity; Transistors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1973.17618
Filename :
1477275
Link To Document :
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