DocumentCode
1044589
Title
Evaluating Pulling Effects in Oscillators Due to Small-Signal Injection
Author
Maffezzoni, Paolo ; Amore, Dario D.
Author_Institution
Dipt. di Elettron. e Inf., Politec. di Milano, Milan
Volume
28
Issue
1
fYear
2009
Firstpage
22
Lastpage
31
Abstract
This paper presents a hybrid numerical-analytical approach to evaluate and quantify injection pulling effects in RF oscillators. The method employs the Floquet nu1(t) eigenvector to project the perturbation signal into the phase domain. An original closed-form expression for the frequency shift induced by small-signal harmonic perturbations is derived. It is shown that such closed-form expression accurately predicts frequency shift under weak pulling, quasi-lock, as well as locked conditions. An estimation of the main spectrum components of the pulled response is also derived. The proposed macromodeling approach has the peculiarity to be applicable to any oscillator topology.
Keywords
injection locked oscillators; perturbation theory; radiofrequency oscillators; Floquet eigenvector; RF oscillators; frequency shift; injection pulling effects; macromodeling; phase domain; small-signal harmonic perturbations; Circuit topology; Closed-form solution; Equations; Injection-locked oscillators; Integrated circuit reliability; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Transmitters; Wireless communication; Injection locking; RF oscillator reliability; injection pulling; oscillator phase-domain macomodeling; perturbation projection vector (PPV);
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2008.2009142
Filename
4723643
Link To Document