Title :
A computer-controlled test facility for film memory arrays
Author_Institution :
IBM Corporation, Burlington, VT, USA
fDate :
9/1/1970 12:00:00 AM
Keywords :
Computer-aided testing; Magnetic film memories; Automatic control; Automatic testing; Clamps; Coils; Computer aided manufacturing; Creep; Instruments; Logic testing; Test facilities; Wire;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066940
