Title :
Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain Analysis
Author :
Olson, Brian D. ; Holman, W. Timothy ; Massengill, Lloyd W. ; Bhuva, Bharat L.
Author_Institution :
Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN
Abstract :
Frequency domain analysis is shown to be useful for quantifying the single-event vulnerability of a mixed-signal circuit. Frequency domain single-event analysis is demonstrated for different pipelined analog-to-digital converter topologies. Design tradeoffs of comparator redundancy are evaluated using a signal-to-noise ratio metric.
Keywords :
analogue-digital conversion; frequency-domain analysis; mixed analogue-digital integrated circuits; frequency domain analysis; mixed-signal circuit; pipelined analog-to-digital converter topologies; radiation-hardened design techniques; signal-to-noise ratio metric; single-event vulnerability; Analog-digital conversion; Circuit noise; Circuit simulation; Circuit testing; Circuit topology; Frequency domain analysis; Pipelines; Redundancy; Signal analysis; Signal to noise ratio; Analog-to-digital converter (ADC); discrete Fourier transforms; pipeline; single-event;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006838
