DocumentCode
1045908
Title
Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power
Author
Casey, M.C. ; Amusan, O.A. ; Nation, S.A. ; Loveless, T.D. ; Balasubramanian, A. ; Bhuva, B.L. ; Reed, R.A. ; McMorrow, D. ; Weller, R.A. ; Alles, M.L. ; Massengill, L.W. ; Melinger, J.S. ; Narasimham, B.
Author_Institution
Electr. Eng. & Comput. Sci. Dept., Vanderbilt Univ., Nashville, TN
Volume
55
Issue
6
fYear
2008
Firstpage
3342
Lastpage
3346
Abstract
The minimum laser energy required to cause sustained harmonic oscillations in a 201-stage ring oscillator varies little with increasing power supply voltage when operating in the subthreshold region. These small changes in threshold laser energy in the subthreshold region suggest that the cross-section curves as a function of power supply voltage remain relatively constant. Simulations show that the minimum pulsewidth required to generate higher-order oscillations decreases as operating voltage increases. Single-event transients are wider when circuits are operating in the subthreshold region than when operating at the nominal power supply voltages. Narrower single-event transients result for strikes on PMOS transistors as compared to those for strikes on NMOS devices in the subthreshold region; the opposite is observed when circuits are operating at the nominal power supply voltages.
Keywords
MOSFET circuits; combinational circuits; low-power electronics; radiation effects; NMOS devices; PMOS transistors; combinational logic circuits; cross-section curves; harmonic oscillations; power supply voltage; single-event effects; single-event transients; subthreshold region; threshold laser energy; Circuit simulation; Combinational circuits; Laser transitions; Power lasers; Power supplies; Power system harmonics; Ring lasers; Ring oscillators; Threshold voltage; Voltage-controlled oscillators; CMOS circuits; digital circuits; radiation effects; radiation effects in ICs; single event transients; single-event effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2005901
Filename
4723780
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