Title :
Strain induced rapid degradation of GaAs, GaAlAs DH injection lasers during CW operation
Author :
Hartman, R.L. ; Hartman, A.R.
fDate :
12/1/1973 12:00:00 AM
Keywords :
Capacitive sensors; DH-HEMTs; Degradation; Diode lasers; Gallium arsenide; Power lasers;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17834