Title :
Temperature fluctuations and flicker noise in p-n junction diodes
Author_Institution :
General Electric Company, Lynchburg, Va.
fDate :
8/1/1974 12:00:00 AM
Abstract :
A simple and elementary calculation is carried out which shows that microscopic temperature fluctuations produced by the shot-noise nature of the p-n junction diode current can cause 1/f-flicker noise.
Keywords :
1f noise; Feedback; Fluctuations; Noise generators; P-n junctions; Semiconductor device noise; Semiconductor diodes; Temperature; Thermal resistance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1974.17962
