DocumentCode
1048083
Title
The effect of Cs-O activation temperature on the surface escape probability of NEA (In,Ga)As photocathodes
Author
Fisher, D.G.
Author_Institution
David Sarnoff Research Center, RCA, Princeton, N. J.
Volume
21
Issue
8
fYear
1974
fDate
8/1/1974 12:00:00 AM
Firstpage
541
Lastpage
542
Abstract
It has been found that the temperature TA at which Cs and O are applied to (In,Ga)As negative electron affinity photocathodes has a strong influence on the surface escape probability B. Over the temperature range investigated, 25-100°C, B changes by a factor of approximately 30.
Keywords
Cathodes; Gallium arsenide; Heating; Ocean temperature; Sea measurements; Sea surface; Surface treatment; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1974.17963
Filename
1477778
Link To Document