• DocumentCode
    1048151
  • Title

    The Mechanism of Breakdown of Dielectrics

  • Author

    Hoover, P.L.

  • Author_Institution
    Research Fellow, The Harvard Engineering School.
  • fYear
    1926
  • Firstpage
    983
  • Lastpage
    997
  • Abstract
    In attempting to analyze various experimental data that have been obtained in researches on dielectric phenomena in high-voltage cable insulation and other dielectrics, the various existing theories of dielectric behavior have seemed inadequate. A critical study has therefore been made of these theories in an attempt to obtain a working hypothesis that more nearly meets the stringent requirements of experimental facts. The logarithmic formula is shown to give erroneous results if applied to high-voltage cables when they are operating under high stress. The gradient in a cable must be calculated from the voltampere characteristic of the dielectric when stresses above the elastic limit are used. For stresses below the elastic limit it makes no difference which method is used, but at high stresses an entirely different gradient distribution is obtained when calculated from the volt-ampere characteristic. Likewise, when an insulation is operated above the elastic limit the stress ceases to be a critical factor, but the strain is of utmost importance. In comparing cables that are operating under high voltages, therefore, the strain at the core should be considered rather than the stress at the core. Stress is given by the voltage gradient and strain by the polarization or the current density in the dielectric. Since there is always a conduction current flowing, there must be mobile or free ions present.
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1926.5061295
  • Filename
    5061295