DocumentCode
1048158
Title
A two-dimensional model for the lateral p—n—p transistor
Author
Seltz, Daniel ; Kidron, Izhak
Author_Institution
Technion--Israel Institute of Technology, Haifa, Israel
Volume
21
Issue
9
fYear
1974
fDate
9/1/1974 12:00:00 AM
Firstpage
587
Lastpage
592
Abstract
A two-dimensional solution of the continuity equation in the base of the lateral p-n-p transistor, including interactions with the substrate and subdiffused layer, is presented for dc excitation. This method is extended to the case of steady-state sinusoidal excitation. Computed and measured results are presented for the frequency dependence of the Short-circuit small-signal current transfer ratios, and comparison of these shows reasonable agreement over the full range of measurements. An approximate equivalent circuit derived from a single-pole fit to the frequency response of short-circuit admittance parameters is inferred to be valid Up to a few megahertz for the device considered.
Keywords
Coordinate measuring machines; Current density; Current measurement; Equations; Frequency dependence; Frequency measurement; Frequency response; Steady-state; Substrates; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1974.17970
Filename
1477785
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