• DocumentCode
    1048158
  • Title

    A two-dimensional model for the lateral p—n—p transistor

  • Author

    Seltz, Daniel ; Kidron, Izhak

  • Author_Institution
    Technion--Israel Institute of Technology, Haifa, Israel
  • Volume
    21
  • Issue
    9
  • fYear
    1974
  • fDate
    9/1/1974 12:00:00 AM
  • Firstpage
    587
  • Lastpage
    592
  • Abstract
    A two-dimensional solution of the continuity equation in the base of the lateral p-n-p transistor, including interactions with the substrate and subdiffused layer, is presented for dc excitation. This method is extended to the case of steady-state sinusoidal excitation. Computed and measured results are presented for the frequency dependence of the Short-circuit small-signal current transfer ratios, and comparison of these shows reasonable agreement over the full range of measurements. An approximate equivalent circuit derived from a single-pole fit to the frequency response of short-circuit admittance parameters is inferred to be valid Up to a few megahertz for the device considered.
  • Keywords
    Coordinate measuring machines; Current density; Current measurement; Equations; Frequency dependence; Frequency measurement; Frequency response; Steady-state; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1974.17970
  • Filename
    1477785