• DocumentCode
    1048872
  • Title

    Wafer-level package interconnect options

  • Author

    Balachandran, Jayaprakash ; Brebels, S. ; Carchon, G. ; Kuijk, Maarten ; Walter De Raedt ; Nauwelaers, Bart K. J. C. ; Beyne, Eric

  • Author_Institution
    IMEC VZW, Heverlee
  • Volume
    14
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    654
  • Lastpage
    659
  • Abstract
    As integrated circuit technology enters the nanometer era, global interconnects are becoming a bottleneck for overall chip performance. In this paper, we show that wafer-level package interconnects are an effective alternative to conventional on-chip global wires. These interconnects behave as LC transmission lines and can be exploited for their near speed of light transmission and low attenuation characteristics. We compare performance measures such as bandwidth, bandwidth density, latency, and power consumption of the package-level transmission lines with conventional on-chip global interconnects for different International Technology Roadmap for Semiconductors (ITRS) technology nodes. Based on these results, we show that package-level interconnects are well suited for power demanding low-latency applications. We also analyze different interconnect options such as memory buses, long inter tile interconnects, clock, and power distribution
  • Keywords
    integrated circuit interconnections; attenuation characteristics; bandwidth; integrated circuit technology; latency; light transmission; long inter tile interconnects; memory buses; on-chip global interconnects; package-level transmission lines; power consumption; power distribution; wafer-level package interconnects; Bandwidth; Distributed parameter circuits; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Optical attenuators; Power transmission lines; Semiconductor device packaging; Wafer scale integration; Wires; Global interconnects; package; performance metrics; transmission lines;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2006.878229
  • Filename
    1661608