DocumentCode
104896
Title
Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias
Author
Qijun Lu ; Zhangming Zhu ; Yintang Yang ; Ruixue Ding
Author_Institution
Sch. of Microelectron., Xidian Univ., Xi´an, China
Volume
62
Issue
5
fYear
2015
fDate
May-15
Firstpage
1544
Lastpage
1552
Abstract
An equivalent-circuit model of shield differential through-silicon vias (SDTSVs) in 3-D integrated circuits (3-D ICs) is proposed in this paper. The proposed model is verified using the 3-D full-wave field solver High Frequency Simulator Structure, showing that it is highly accurate up to 100 GHz. Furthermore, a full-wave extraction method for the resistance-inductance-capacitance-conductance (RLCG) parameters of SDTSVs is also proposed in this paper, which can be applied to all of differential transmission lines. It is shown that the results of the RLCG parameters obtained from the full-wave extraction method agree well with that from the analytical calculation up to 100 GHz, further validating the accuracy of the proposed model. Finally, using the proposed model, a deep analysis of electrical characteristics of SDTSVs is carried out to provide helpful design guidelines for them in future 3-D ICs.
Keywords
RLC circuits; equivalent circuits; integrated circuit modelling; three-dimensional integrated circuits; transmission lines; 3D ICs; 3D full-wave field solver high frequency simulator structure; 3D integrated circuits; RLCG parameters; SDTSVs; differential transmission lines; electrical modeling; equivalent-circuit model; full-wave extraction method; resistance-inductance-capacitance-conductance parameters; shield differential through-silicon vias characterization; Analytical models; Capacitance; Insertion loss; Integrated circuit modeling; Through-silicon vias; Wires; 3-D integrated circuits (3-D ICs); even mode; odd mode; resistance-inductance-capacitance-conductance (RLCG) parameters; resistance???inductance???capacitance???conductance (RLCG) parameters; shield differential through-silicon vias (SDTSVs); shield differential through-silicon vias (SDTSVs).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2410312
Filename
7061957
Link To Document