• DocumentCode
    104896
  • Title

    Electrical Modeling and Characterization of Shield Differential Through-Silicon Vias

  • Author

    Qijun Lu ; Zhangming Zhu ; Yintang Yang ; Ruixue Ding

  • Author_Institution
    Sch. of Microelectron., Xidian Univ., Xi´an, China
  • Volume
    62
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    1544
  • Lastpage
    1552
  • Abstract
    An equivalent-circuit model of shield differential through-silicon vias (SDTSVs) in 3-D integrated circuits (3-D ICs) is proposed in this paper. The proposed model is verified using the 3-D full-wave field solver High Frequency Simulator Structure, showing that it is highly accurate up to 100 GHz. Furthermore, a full-wave extraction method for the resistance-inductance-capacitance-conductance (RLCG) parameters of SDTSVs is also proposed in this paper, which can be applied to all of differential transmission lines. It is shown that the results of the RLCG parameters obtained from the full-wave extraction method agree well with that from the analytical calculation up to 100 GHz, further validating the accuracy of the proposed model. Finally, using the proposed model, a deep analysis of electrical characteristics of SDTSVs is carried out to provide helpful design guidelines for them in future 3-D ICs.
  • Keywords
    RLC circuits; equivalent circuits; integrated circuit modelling; three-dimensional integrated circuits; transmission lines; 3D ICs; 3D full-wave field solver high frequency simulator structure; 3D integrated circuits; RLCG parameters; SDTSVs; differential transmission lines; electrical modeling; equivalent-circuit model; full-wave extraction method; resistance-inductance-capacitance-conductance parameters; shield differential through-silicon vias characterization; Analytical models; Capacitance; Insertion loss; Integrated circuit modeling; Through-silicon vias; Wires; 3-D integrated circuits (3-D ICs); even mode; odd mode; resistance-inductance-capacitance-conductance (RLCG) parameters; resistance???inductance???capacitance???conductance (RLCG) parameters; shield differential through-silicon vias (SDTSVs); shield differential through-silicon vias (SDTSVs).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2410312
  • Filename
    7061957