Title :
Thermomagnetic behavior of hard magnetic thin films
Author :
Ouch, Kazuhiro ; Iwasaki, Shun-ichi ; Ouchi, Kazuo ; Iwasaki, Shoichi
Author_Institution :
Tohoku University, Sendai, Japan
fDate :
9/1/1972 12:00:00 AM
Abstract :
The annealing behavior of hard magnetic films of the Co-M system (M = Ni, P) was followed using differential thermal analysis. These studies showed that the thermal behavior of electrodeposited Co, Co-P, Co-Ni, and Co-Ni-P films is different from that of chemically deposited Co-P films. The most pronounced reaction was found to be exothermic and occurred between 200°C and 300°C. After thermally stabilizing these films at 500°C for 1 hour in a vacuum, the temperature dependence of Hcwas found to depend on additive content and crystallite orientation. Films with low additive contents and hcp
Keywords :
Cobalt-nickel films; Cobalt-phosphorus films; Nickel-cobalt films; Thermomagnetic recording materials; Annealing; Chemical analysis; Cobalt; Crystallization; Magnetic analysis; Magnetic films; Magnetic recording; Nickel; Temperature dependence; Temperature sensors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1972.1067372