• DocumentCode
    1050002
  • Title

    An electron beam maskmaker

  • Author

    Beasley, James P. ; Squire, Desmond G.

  • Author_Institution
    Mullard Research Laboratories, Redhill, Surrey, England
  • Volume
    22
  • Issue
    7
  • fYear
    1975
  • fDate
    7/1/1975 12:00:00 AM
  • Firstpage
    376
  • Lastpage
    384
  • Abstract
    An electron beam machine is described, in which the ¼-µm diameter beam is computer controlled to define integrated circuit and other fine patterns at their final size in response to a coordinate data input. Electron sensitive resist is exposed on metallized quartz or glass substrates. Resist development followed by metal etching enables masks to be made, either for subsequent photolithography or, more usually, for use in the electron image projector developed by J. P. Scott. The mask drawing process is entirely automatic and the emphasis is on the rapid generation of complex patterns with high precision. A two-stage deflection system enables rectangular pattern elements to be drawn at a 10-MHz stepping rate and accurately positioned throughout a 2-mm square main deflection field. Patterns are automatically positioned, to an accuracy of ±1/8 µm, relative to an array of markers predeposited on the substrate. The beam is also refocused automatically at the markers. A mechanical stage for the substrate enables 50 × 50-mm arrays of patterns to be built up. A complete mask containing detail as small as 1 µm takes 1-3 h to draw. Finer patterns can be drawn, although more slowly.
  • Keywords
    Electron beams; Electron optics; High speed optical techniques; Lithography; Optical films; Optical pumping; Optical sensors; Silicon; Substrates; Valves;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1975.18148
  • Filename
    1477983