DocumentCode :
1051244
Title :
Two-dimensional analysis of triode-like operation of junction gate FET´s
Author :
Yamaguchi, K. ; Toyabe, T. ; Kodera, H.
Author_Institution :
Hitachi, Ltd., Tokyo, Japan
Volume :
22
Issue :
11
fYear :
1975
fDate :
11/1/1975 12:00:00 AM
Firstpage :
1047
Lastpage :
1049
Abstract :
Triode-like operation of junction gate FET´s is analyzed by two-dimensional computer simulation. Triode-like characteristics are shown to appear with the channel normally off and the depletion layer reaching the drain electrode. Triode-like current arises from carrier injection from the source electrode into the depleted region. Triode-like operation is achieved without intrinsic material.
Keywords :
Computer simulation; Electrodes; Electron mobility; Electron tubes; FETs; Neodymium; Power amplifiers; Solid state circuits; Uncertainty; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1975.18268
Filename :
1478103
Link To Document :
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