Title :
Autoprobe testing for emitter—Collector spikes in microwave bipolar transistors
Author_Institution :
Tektronix, Inc., Beaverton, Ore.
fDate :
11/1/1975 12:00:00 AM
Abstract :
Direct-current characteristics of microwave bipolar transistors with emitter-collector spikes are examined. Measured data from a large sample of spiked transistors are evaluated and related to the FET model of a spike. A suitable test for spiking is developed for use in a dc autoprobe program. Typical results from a wafer are presented.
Keywords :
Automatic testing; Bipolar transistors; Electrical resistance measurement; Integrated circuit testing; Microwave FETs; Microwave transistors; Scattering; Semiconductor device modeling; System testing; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1975.18271
