Title :
A New Method for RTS Noise of Semiconductor Devices Identification
Author :
Konczakowska, Alicja ; Cichosz, Jacek ; Szewczyk, Arkadiusz
Author_Institution :
Gdansk Univ. of Technol., Gdansk
fDate :
6/1/2008 12:00:00 AM
Abstract :
In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included.
Keywords :
burst noise; noise measurement; semiconductor device noise; RTS noise; noise scattering pattern method; random telegraph signal noise identification; semiconductor devices; Noise scattering pattern method (NSP method); random telegraph signal (RTS) noise; semiconductor devices;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.915098
