Title :
SiGe HBT´s Small-Signal Pi Modeling
Author :
Yang, Tian-Ren ; Tsai, Julius Ming-Lin ; Ho, Chih-Long ; Hu, Robert
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu
fDate :
7/1/2007 12:00:00 AM
Abstract :
This paper presents the derivation procedure used in determining the parameters in SiGe HBT´s small-signal model where the Pi circuit configuration is employed. For both the transistor´s external base-collector capacitor and its base spreading resistor, new close-form expressions have been derived. Comparisons with existing approaches vindicate the feasibility and effectiveness of our formulations. With the impact of the lossy substrate effectively modeled and the frequency dependency of the transconductance properly addressed, this proposed extraction approach demonstrates accurate results up to 30 GHz with different bias conditions.
Keywords :
Ge-Si alloys; capacitors; heterojunction bipolar transistors; resistors; semiconductor device models; Pi circuit; SiGe - Interface; base spreading resistor; external base-collector capacitor; heterojunction bipolar transistors; Capacitors; Circuits; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Parasitic capacitance; Resistors; Silicon germanium; Testing; Transconductance; Base spreading resistor; HBT; Pi model; SiGe;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2007.900214