DocumentCode :
1051861
Title :
A Testing Method on Poly-Si Thin-Film Transistor Array for Active-Matrix Organic Emitting Display
Author :
Liu, Xueqiang ; Zhang, Tong ; Wang, Lijie ; Xia, Zhiqiang ; Li, Mingyou ; Liu, Shiyong
Author_Institution :
State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun
Volume :
4
Issue :
2
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
229
Lastpage :
232
Abstract :
A novel method is introduced using to evaluate the quality of thin-film transistor (TFT) array for driving active-matrix display (OLED). By the means of this method, the operation states of the TFT or the defects of TFT can be judged. It is a current testing method with the advantages of fast response, excellent precision, no effect to aperture and no damage to the display array.
Keywords :
integrated circuit testing; matrix algebra; organic light emitting diodes; polymer films; silicon; thin film transistors; active-matrix organic emitting display; display array; driving active-matrix display; poly thin-film transistor array; Active-matrix driving; current test; organic light-emitting display (OLED); simulation; thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2007.913813
Filename :
4443884
Link To Document :
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