An experimental investigation of the end-hat effects in a crossed-field amplifier via three-dimensional electron density measurements

Author

Ye, John Z. ; Chan, Chung ; MacGregor, Robert ; Ruden, Thomas E.

Author_Institution

Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA

Volume

41

Issue

2

fYear

1994

fDate

2/1/1994 12:00:00 AM

Firstpage

258

Lastpage

265

Abstract

In situ three-dimensional electron density profile measurements have been made for the first time to study the end-hat space-charge region in a crossed-field amplifier. It has been found that a separated electron population exists in that region and is detached from the main beam when the end-hats are biased positively with respect to the sole. An investigation into the vacuum electric field profile and the overall device performance versus end-hat bias has suggested that such an electron population may be caused by a redistribution of the beam electrons by the axial and radial end-hat electric field

Keywords

electron density; microwave amplifiers; microwave tubes; space charge; 160 MHz; 8 dB; axial end-hat electric field; beam electron redistribution; crossed-field amplifier; device performance; end-hat bias; end-hat effects; radial end-hat electric field; separated electron population; space-charge region; three-dimensional electron density measurements; vacuum electric field profile; Anodes; Density measurement; Electrodes; Electron beams; Frequency; Magnetic analysis; Magnetic confinement; Magnetic fields; Magnetic separation; Noise generators;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.277369

Filename

277369