DocumentCode :
1053182
Title :
Finite element modelling of nanostructured piezoelectric resonators (NAPIERs)
Author :
Southin, Joe E A ; Whatmore, Roger W.
Author_Institution :
Cranfield Univ., Bedford, UK
Volume :
51
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
654
Lastpage :
662
Abstract :
A new modification to the traditional piezoelectric thin film bulk acoustic wave resonator (FBAR) and solidly mounted acoustic wave resonator (SMR) is proven to significantly improve their performances. The proposed design involves the surface micro/nano structuring of planar piezoelectric thin films to realize an array of a large number of rod-like structures. In contrast to the plate-like thickness extensional resonance in traditional FBAR and SMR devices, the rod-like structures can be excited in their length extensional resonance, yielding a higher electromechanical coupling factor and effectively eliminating the spurious resonances from lateral modes of vibration. The designs have been investigated by two and three-dimensional finite element analyses and one-dimensional transmission-line modelling. The results show that significant increases in the electromechanical coupling factor of ca. 40% can be achieved by using the rod-like length extensional resonances as compared with the plate-like thickness extensional resonances in traditional devices. Simulations show that rod width-to-thickness aspect ratios of less than 0.5 could result in an electromechanical coupling factor (k/sub eff//sup 2/) of over 10% for a zinc oxide device, compared with approximately 7% for a conventional design.
Keywords :
II-VI semiconductors; III-V semiconductors; aluminium compounds; crystal microstructure; electromechanical effects; finite element analysis; lead compounds; nanostructured materials; piezoelectric materials; piezoelectric semiconductors; piezoelectric thin films; semiconductor device models; semiconductor devices; surface acoustic wave resonators; surface structure; thin film devices; transmission line theory; wide band gap semiconductors; zinc compounds; AlN; PZT; PbZrO3TiO3; ZnO; electromechanical coupling; extensional resonance; finite element modelling; nanostructured piezoelectric resonators; one-dimensional transmission line modelling; piezoelectric thin film bulk acoustic wave resonator; rod like structures array; solidly mounted acoustic wave resonator; surface microstructure; surface nanostructure; three-dimensional finite element analysis; zinc oxide device; Acoustic waves; Couplings; Electrodes; Film bulk acoustic resonators; Finite element methods; Piezoelectric devices; Piezoelectric films; Piezoelectric materials; Resonance; Substrates;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2004.1304263
Filename :
1320845
Link To Document :
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