The influence of the topology of test circuits on the interrupting performance of circuit breakers

Author

Schavemaker, P.H. ; van der Sluis, L.

Author_Institution

Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands

Volume

10

Issue

4

fYear

1995

fDate

10/1/1995 12:00:00 AM

Firstpage

1822

Lastpage

1828

Abstract

High-voltage circuit breakers are tested in the high power laboratory where transient recovery voltages (TRVs) are generated by networks consisting of lumped elements. In the IEC and ANSI standards. the TRV waveforms are described, but not the topology of the test circuits. This paper compares different direct TRV test circuits which generate the same initial part of the TRV waveform. It is demonstrated that the surge impedance of the TRV test circuit is an important parameter. The difference in interrupting performance of the test breaker in the test circuits with the different surge impedances is caused by the influence of the arc-circuit interaction

Keywords

ANSI standards; arcs (electric); circuit-breaking arcs; network topology; switchgear testing; test equipment; ANSI standards; HV circuit breakers; IEC standards; arc-circuit interaction; high power laboratory; interrupting performance; surge impedance; test circuit topology; transient recovery voltages; Circuit breakers; Circuit testing; Circuit topology; Impedance; Laboratories; Network topology; Power generation; Surges; Transient analysis; Voltage;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/61.473374

Filename

473374