Title :
A historical perspective on the development of MOS transistors and related devices
Author_Institution :
Bell Laboratories, Murray Hill, NJ
fDate :
7/1/1976 12:00:00 AM
Keywords :
Charge carrier density; Conductors; Explosions; Laboratories; MOSFETs; Marketing and sales; Surface impedance; Telephony; Thin film circuits; Thin film transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1976.18468
