Title :
Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor
Author :
Velazco, R. ; Karoui, S. ; Chapuis, T. ; Benezech, D. ; Rosier, L.H.
fDate :
6/1/1992 12:00:00 AM
Abstract :
The authors present a set of techniques making it possible to perform heavy-ion testing on present 32-bit microprocessors. In particular, they study how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as a Cf252 fission-decay source
Keywords :
integrated circuit testing; ion beam effects; microprocessor chips; satellite computers; 32-bit microprocessors; 68020 microprocessor; 68882 coprocessor; Cf252 fission-decay source; Motorola; experimental results; heavy-ion testing; particle accelerators; program dependent cross-section; set of techniques; space environment; upset cross-section; Circuit testing; Coprocessors; Digital systems; Linear particle accelerator; Microprocessors; Performance evaluation; Radiation detectors; Registers; Single event upset; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
